HORIBA announces a new entry-level multimodal characterization system for true simultaneous colocated measurements

HORIBA announces a new entry-level multimodal characterization system for true simultaneous colocated measurements

PISCATAWAY, NJ – March 4, 2025 – HORIBA, a global leader in analysis and measurement technologies, proudly announces the launch of SignatureSPM™, a new, multimodal characterization system based on an automated Atomic Force Microscopy (AFM) platform and integrated with a Raman/Photoluminescence spectrometer. This innovative system enables simultaneous, colocalized measurements and provides unprecedented insight into the physical and chemical properties of materials.

SignatureSPM is a microscope based on a multimodal characterization platform that integrates an automated atomic force microscope (AFM) with a Raman/photoluminescence spectrometer, enabling true colocalized measurements of physical and chemical properties.

SignatureSPM provides comprehensive analysis of topographic, mechanical, electrical, magnetic, optical and chemical data in a single real-time measurement. This integrated solution requires less sample handling and enables faster colocated data collection, streamlining workflow and delivering results in less time.

The SignatureSPM combines AFM with Raman and photoluminescence spectroscopy to improve chemical identification. It's easy to use and has minimal learning curve, allowing users to start taking measurements in under five minutes. Its stability, speed and ease of use make it ideal for nanotechnology research and materials characterization.

The SignatureSPM is based on the proven power of SmartSPM software, which combines an AFM scanner, a NIR feedback laser, full automation of AFM probe alignment, tip approximation and AFM feedback optimization, including dynamic scan rate adjustment without image distortion.

The SignatureSPM's AFM can perform large scans and molecular resolution, with an emphasis on stability through fast response time, low noise, low drift and metrological traceability. Control algorithms supported by the digital controller enable unprecedented scanning speeds and high-resolution imaging, even with online speed changes.

Combining AFM with Raman spectroscopy and photoluminescence enables the simultaneous analysis of a material's surface topography, chemical composition and electronic properties at the nanoscale. This enables a comprehensive understanding of the structure and functionality of a sample with precise spatial correlation between the different types of data, which is particularly useful in areas such as materials science, chemistry, biology, nanotechnology, semiconductor research and life sciences. Crucially, NIR feedback enables true light-on/light-off measurements for light-sensitive materials.

SignatureSPM has fully integrated multiple AFM modes including:

• Kelvin-Sondenmikroskopie
• Piezo Response Force Mikroskopie
• Magnetkraftmikroskopie
• Nanolithographie
• Kraftkurvenmessungen

“The design of the SignatureSPM is based on HORIBA’s commitment to developing innovative analysis and automation solutions that meet the needs of scientists and researchers,” said Joao-Lucas Rangel, AFM and AFM-Raman product manager at HORIBA. “The SignatureSPM will enable precise, multimodal measurements, making it a highly relevant tool for cutting-edge research.”

For more information about the new SignatureSPM Multimodal Characterization System, visit HORIBA.com

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